Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
White, Mark (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) MacNeal, Kristen (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Cooper, Mark (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
April 10, 2015
Publication Date
January 28, 2012
Subject Category
Electronics And Electrical EngineeringQuality Assurance And Reliability Meeting Information
Meeting: IEEE Reliability and Maintainability Symposium (RAMS)
Location: Orlando, FL
Country: United States
Start Date: January 28, 2012
End Date: January 30, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Keywords
reliabilityspacecraft systemsultra low powerscaled CMOS