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TID Test Results for 4th Generation iPad(TradeMark)TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.
Document ID
20150007848
Document Type
Conference Paper
External Source(s)
Authors
Guertin, S. M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Allen, G. R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
McClure, S. S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
LaBel, K. A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
May 11, 2015
Publication Date
July 8, 2013
Subject Category
Electronics and Electrical Engineering
Meeting Information
2013 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2013)(San Francisco, CA)
Distribution Limits
Public
Copyright
Other
Keywords
MSL
SEE
Display Failure
Charge Circuit Failure
Curiosity