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Simulating and Detecting Radiation-Induced Errors for Onboard Machine LearningSpacecraft processors and memory are subjected to high radiation doses and therefore employ radiation-hardened components. However, these components are orders of magnitude more expensive than typical desktop components, and they lag years behind in terms of speed and size. We have integrated algorithm-based fault tolerance (ABFT) methods into onboard data analysis algorithms to detect radiation-induced errors, which ultimately may permit the use of spacecraft memory that need not be fully hardened, reducing cost and increasing capability at the same time. We have also developed a lightweight software radiation simulator, BITFLIPS, that permits evaluation of error detection strategies in a controlled fashion, including the specification of the radiation rate and selective exposure of individual data structures. Using BITFLIPS, we evaluated our error detection methods when using a support vector machine to analyze data collected by the Mars Odyssey spacecraft. We found ABFT error detection for matrix multiplication is very successful, while error detection for Gaussian kernel computation still has room for improvement.
Document ID
20150008436
Document Type
Conference Paper
External Source(s)
Authors
Wagstaff, Kiri L. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Bornstein, Benjamin (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Granat, Robert (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Tang, Benyang (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Turmon, Michael (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 19, 2015
Publication Date
July 19, 2009
Subject Category
Space Radiation
Computer Systems
Cybernetics, Artificial Intelligence and Robotics
Meeting Information
IEEE International Conference on Space Mission Challenges for Information Technology(Pasadena, CA)
Distribution Limits
Public
Copyright
Other
Keywords
data analysis