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Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion LaboratoryThis paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.
Document ID
20150008535
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/44752
Authors
McClure, Steven S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Allen, Gregory R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Irom, Farokh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Scheick, Leif Z. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Adell, Philippe C. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Miyahira, Tetsuo F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 20, 2015
Publication Date
July 19, 2010
Subject Category
Spacecraft Design, Testing And Performance
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Workshop
Location: Denver, CO
Country: United States
Start Date: July 19, 2010
End Date: July 23, 2010
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
analog switches
oscillators
FPGA
drivers
SDRAM
ADC
voltage comparator
voltage regulator
microprocessors

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