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Range-Gated Metrology: An Ultra-Compact Sensor for Dimensional StabilizationPoint-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. Existing sensors are large and intrusive, however, with optical heads that consist of several optical elements and require multiple optical fiber connections. The use of point-to-point laser metrology has therefore been limited to applications where only a few gauges are needed and there is sufficient space to accommodate them. Range-Gated Metrology is a signal processing technique that preserves nanometer-level or better performance while enabling: (1) a greatly simplified optical head - a single fiber optic collimator - that can be made very compact, and (2) a single optical fiber connection that is readily multiplexed. This combination of features means that it will be straightforward and cost-effective to embed tens or hundreds of compact metrology gauges to stabilize a large structure. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.
Document ID
20150008609
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Lay, Oliver P.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dubovitsky, Serge
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Shaddock, Daniel A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ware, Brent
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Woodruff, Christopher S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 20, 2015
Publication Date
June 23, 2008
Subject Category
Lasers And Masers
Instrumentation And Photography
Electronics And Electrical Engineering
Optics
Meeting Information
Meeting: SPIE Astronomical Instrumentation Conference
Location: Marseille
Country: France
Start Date: June 23, 2008
End Date: June 28, 2008
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
laser metrology

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