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Reliability Assessment of Wide Bandgap Power DevicesNo abstract available
Document ID
20150021852
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Boomer, Kristen (NASA Glenn Research Center Cleveland, OH United States)
Scheick, Leif (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Casey, Megan (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Hammoud, Ahmad (Vantage Partners, LLC Brook Park, OH, United States)
Date Acquired
November 25, 2015
Publication Date
June 23, 2015
Subject Category
Quality Assurance And Reliability
Electronics And Electrical Engineering
Report/Patent Number
GRC-E-DAA-TN24519
Meeting Information
Meeting: NEPP Electronics Technology Workshop
Location: Greenbelt, MD
Country: United States
Start Date: June 23, 2015
End Date: June 26, 2015
Sponsors: NASA Goddard Space Flight Center
Funding Number(s)
CONTRACT_GRANT: NNC12BA01B
WBS: WBS 724297.40.49.03.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Power Transistors
Thermal Cycling
Radiation Exposure

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