NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Long-Term Characterization of 6H-SiC Transistor Integrated Circuit Technology Operating at 500 CNASA has been developing very high temperature semiconductor integrated circuits for use in the hot sections of aircraft engines and for Venus exploration. This paper reports on long-term 500 C electrical operation of prototype 6H-SiC integrated circuits based on epitaxial 6H-SiC junction field effect transistors (JFETs). As of this writing, some devices have surpassed 4000 hours of continuous 500 C electrical operation in oxidizing air atmosphere with minimal change in relevant electrical parameters.




Document ID
20150022217
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Neudeck, Philip G.
(NASA Glenn Research Center Cleveland, OH, United States)
Spry, David J.
(Ohio Aerospace Inst. Cleveland, OH, United States)
Chen, Liang-Yu
(Ohio Aerospace Inst. Cleveland, OH, United States)
Chang, Carl W.
(ASRC Aerospace Corp. Cleveland, OH, United States)
Beheim, Glenn M.
(NASA Glenn Research Center Cleveland, OH, United States)
Okojie, Robert S.
(NASA Glenn Research Center Cleveland, OH, United States)
Evans, Laura J.
(NASA Glenn Research Center Cleveland, OH, United States)
Meredith Roger D.
(NASA Glenn Research Center Cleveland, OH, United States)
Ferrier, Terry L.
(NASA Glenn Research Center Cleveland, OH, United States)
Krasowski, Michael J.
(NASA Glenn Research Center Cleveland, OH, United States)
Prokop, Norman F.
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
December 3, 2015
Publication Date
March 24, 2008
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
1069-D11-02
GRC-WO-667837
Meeting Information
Meeting: Spring 2008 Materials Research Society Meeting
Location: San Francisco, CA
Country: United States
Start Date: March 24, 2008
End Date: March 28, 2008
Sponsors: Materials Research Society
Funding Number(s)
WBS: WBS 122711.03.11.03.04.03.02
Distribution Limits
Public
Copyright
Public Use Permitted.
No Preview Available