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Phase-Retrieval Uncertainty Estimation and Algorithm Comparison for the JWST-ISIM Test CampaignPhase retrieval, the process of determining the exitpupil wavefront of an optical instrument from image-plane intensity measurements, is the baseline methodology for characterizing the wavefront for the suite of science instruments (SIs) in the Integrated Science Instrument Module (ISIM) for the James Webb Space Telescope (JWST). JWST is a large, infrared space telescope with a 6.5-meter diameter primary mirror. JWST is currently NASA's flagship mission and will be the premier space observatory of the next decade. ISIM contains four optical benches with nine unique instruments, including redundancies. ISIM was characterized at the Goddard Space Flight Center (GSFC) in Greenbelt, MD in a series of cryogenic vacuum tests using a telescope simulator. During these tests, phase-retrieval algorithms were used to characterize the instruments. The objective of this paper is to describe the Monte-Carlo simulations that were used to establish uncertainties (i.e., error bars) for the wavefronts of the various instruments in ISIM. Multiple retrieval algorithms were used in the analysis of ISIM phase-retrieval focus-sweep data, including an iterativetransform algorithm and a nonlinear optimization algorithm. These algorithms emphasize the recovery of numerous optical parameters, including low-order wavefront composition described by Zernike polynomial terms and high-order wavefront described by a point-by-point map, location of instrument best focus, focal ratio, exit-pupil amplitude, the morphology of any extended object, and optical jitter. The secondary objective of this paper is to report on the relative accuracies of these algorithms for the ISIM instrument tests, and a comparison of their computational complexity and their performance on central and graphical processing unit clusters. From a phase-retrieval perspective, the ISIM test campaign includes a variety of source illumination bandwidths, various image-plane sampling criteria above and below the Nyquist- Shannon critical sampling value, various extended object sizes, and several other impactful effects.
Document ID
20160003130
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Aronstein, David L.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Smith, J. Scott
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
March 8, 2016
Publication Date
March 5, 2016
Subject Category
Astronomy
Systems Analysis And Operations Research
Instrumentation And Photography
Report/Patent Number
GSFC-E-DAA-TN30236
Meeting Information
Meeting: Institute of Electrical and Electronics Engineers (IEEE) Aerospace Conference
Location: Big Sky, MT
Country: United States
Start Date: March 5, 2016
End Date: March 12, 2016
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
Design Analysis
Optical Equipment
Lens Design

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