Acquisition Source
Jet Propulsion Laboratory
Authors
Edmonds, L. D. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
May 2, 2016
Publication Date
March 1, 2016
Subject Category
Electronics And Electrical Engineering Distribution Limits
Public
Keywords
floating gateionizing radiationflash memoryfloating gate charge loss