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A Method for Estimating the Probability of Floating Gate Prompt Charge Loss in a Radiation EnvironmentBecause advancing technology has been producing smaller structures in electronic circuits, the floating gates in modern flash memories are becoming susceptible to prompt charge loss from ionizing radiation environments found in space. A method for estimating the risk of a charge-loss event is given.
Document ID
20160005612
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other
External Source(s)
hdl:2014/45480
Authors
Edmonds, L. D. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 2, 2016
Publication Date
March 1, 2016
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
JPL-Publ-16-9
Distribution Limits
Public
Copyright
Other
Keywords
floating gate
ionizing radiation
flash memory
floating gate charge loss

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