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Challenges and Techniques in Measurements of Noise, Cryogenic Noise and Power in Millimeter-Wave and Submillimeter-Wave AmplifiersWe will present the topic of noise measurements, including cryogenic noise measurements, of Monolithic Microwave Integrated Circuit (MMIC) and Sub-Millimeter-Wave Monolithic Microwave Integrated Circuit (S-MMIC) amplifiers, both on-wafer, and interfaced to waveguide modules via coupling probes. We will also present an overview of the state-of-the-art in waveguide probe techniques for packaging amplifier chips, and discuss methods to obtain the lowest loss packaging techniques available to date. Linearity in noise measurements will be discussed, and experimental methods for room temperature and cryogenic noise measurements will be presented. We will also present a discussion of power amplifier measurements for millimeter-wave and submillimeter-wave amplifiers, and the tools and hardware needed for this characterization.
Document ID
20160005635
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
Authors
Samoska, Lorene
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
May 2, 2016
Publication Date
June 2, 2014
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Automatic Radio Frequency Techniques Group (AFRTG) Conference
Location: Tampa Bay, FL
Country: United States
Start Date: June 6, 2014
Sponsors: Automatic Radio Frequency Techniques Group (ARFTG), Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other

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