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In-Process Thermal Imaging of the Electron Beam Freeform Fabrication ProcessResearchers at NASA Langley Research Center have been developing the Electron Beam Freeform Fabrication (EBF3) metal additive manufacturing process for the past 15 years. In this process, an electron beam is used as a heat source to create a small molten pool on a substrate into which wire is fed. The electron beam and wire feed assembly are translated with respect to the substrate to follow a predetermined tool path. This process is repeated in a layer-wise fashion to fabricate metal structural components. In-process imaging has been integrated into the EBF3 system using a near-infrared (NIR) camera. The images are processed to provide thermal and spatial measurements that have been incorporated into a closed-loop control system to maintain consistent thermal conditions throughout the build. Other information in the thermal images is being used to assess quality in real time by detecting flaws in prior layers of the deposit. NIR camera incorporation into the system has improved the consistency of the deposited material and provides the potential for real-time flaw detection which, ultimately, could lead to the manufacture of better, more reliable components using this additive manufacturing process.
Document ID
20160009055
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Taminger, Karen M.
(NASA Langley Research Center Hampton, VA, United States)
Domack, Christopher S.
(Analytical Mechanics Associates, Inc. Hampton, VA, United States)
Zalameda, Joseph N.
(NASA Langley Research Center Hampton, VA, United States)
Taminger, Brian L.
(Analytical Mechanics Associates, Inc. Hampton, VA, United States)
Hafley, Robert A.
(NASA Langley Research Center Hampton, VA, United States)
Burke, Eric R.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
July 15, 2016
Publication Date
April 17, 2016
Subject Category
Metals And Metallic Materials
Report/Patent Number
NF1676L-22574
Meeting Information
Meeting: SPIE Commercial + Scientific Sensing and Imaging
Location: Baltimore, MD
Country: United States
Start Date: April 17, 2016
End Date: April 21, 2016
Sponsors: International Society for Optical Engineering
Funding Number(s)
WBS: WBS 081876.02.07.50.01.01
Distribution Limits
Public
Copyright
Public Use Permitted.
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