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Crystallographic Characterization of Extraterrestrial Materials by Energy-Scanning X-ray DiffractionWe have continued our long-term project using X-ray diffraction to characterize a wide range of extraterrestrial samples. The stationary sample method with polychromatic X-rays is advantageous because the irradiated area of the sample is always same and fixed, meaning that all diffraction spots occur from the same area of the sample, however, unit cell parameters cannot be directly obtained by this method though they are very important for identification of mineral and for determination of crystal structures. In order to obtain the cell parameters even in the case of the sample stationary method, we apply energy scanning of a micro-beam of monochromatic SR at SPring-8.
Document ID
20160009079
Acquisition Source
Johnson Space Center
Document Type
Abstract
Authors
Hagiya, Kenji
(Hyogo Univ. Hyogo, Japan)
Mikouchi, Takashi
(Tokyo Univ. Japan)
Ohsumi, Kazumasa
(Japan Synchrotron Research Inst. Hyogo, Japan)
Terada, Yasuko
(Japan Synchrotron Research Inst. Hyogo, Japan)
Yagi, Naoto
(Japan Synchrotron Research Inst. Hyogo, Japan)
Komatsu, Mutsumi
(Graduate Univ. for Advanced Studies (SOKENDAI) Tachikawa, Japan)
Yamaguchi, Shoki
(Hyogo Univ. Hyogo, Japan)
Hirata, Arashi
(Hyogo Univ. Hyogo, Japan)
Kurokawa, Ayaka
(Hyogo Univ. Hyogo, Japan)
Zolensky, Michael E.
(NASA Johnson Space Center Houston, TX, United States)
Date Acquired
July 15, 2016
Publication Date
September 12, 2016
Subject Category
Lunar And Planetary Science And Exploration
Report/Patent Number
JSC-CN-36625
Meeting Information
Meeting: SPring-8 Users Community (SPRUC) Conference
Location: Hyogo
Country: Japan
Start Date: September 12, 2016
End Date: September 13, 2016
Sponsors: Japan Synchrotron Research Inst.
Distribution Limits
Public
Copyright
Public Use Permitted.
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