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Field Programmable Gate Aray (FPGA) Radiation Data: All Data is Not Equal
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Author and Affiliation:
Label, Kenneth A.(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Berg, Melanie D.(ASRC Federal Space and Defense, Greenbelt, MD, United States)
Abstract: Electronic parts (integrated circuits) have grown in complexity such that determining all failure modes and risks based on single particle event radiation testing is impossible. In this presentation, the authors will present why this is so and provide some realism on what this means to FPGAs. Its all about understanding actual risks and not making assumptions.
Publication Date: Aug 23, 2016
Document ID:
20160010570
(Acquired Jan 27, 2017)
Subject Category: ELECTRONICS AND ELECTRICAL ENGINEERING; QUALITY ASSURANCE AND RELIABILITY
Report/Patent Number: GSFC-E-DAA-TN34562
Document Type: Oral/Visual Presentation
Contract/Grant/Task Num: NNG13CR48C
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD United States
Organization Source: NASA Goddard Space Flight Center; Greenbelt, MD United States
Description: 22p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright; Distribution as joint owner in the copyright
NASA Terms: ELECTRONIC EQUIPMENT TESTS; ERROR ANALYSIS; FAILURE MODES; FIELD-PROGRAMMABLE GATE ARRAYS; INTEGRATED CIRCUITS; RADIATION MEASUREMENT; RISK; SINGLE EVENT UPSETS; ACCURACY; CIRCUIT RELIABILITY; COMMERCIAL OFF-THE-SHELF PRODUCTS; COMPLETENESS; COMPUTER PROGRAM INTEGRITY; DATA ACQUISITION; DATA PROCESSING
Other Descriptors: FIELD PROGRAMMABLE GATE ARAY (FPGA); RADIATION TESTING; SINGLE EVENT EFFECT (SEE)
Miscellaneous Notes: Conference Meeting: Field Programmable Gate Array Symposium, Chantilly, VA, 8/23/2016; Released on https://nepp.nasa.gov 2/10/2017
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