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Total Ionizing Dose Test Report for the MB85AS4MT ReRAMThis is a Total Ionizing Dose (TID) test report for the Fujitsu Semiconductor MB85AS4MT Resistive Random Access Memory (ReRAM).
Document ID
20170002638
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Chen, Dakai (NASA Goddard Space Flight Center Greenbelt, MD United States)
Wilcox, Edward (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
March 29, 2017
Publication Date
February 14, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN39593
Report Number: GSFC-E-DAA-TN39593
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Total Ionizing Dose (TID)
radio frequency

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