Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Crowley, Kevin T. (Princeton Univ. Princeton, NJ, United States) Choi, Steve K. (Princeton Univ. Princeton, NJ, United States) Kuan, Jeffrey (Princeton Univ. Princeton, NJ, United States) Austermann, Jason E. (National Inst. of Standards and Technology Boulder, CO, United States) Beall, James A. (National Inst. of Standards and Technology Boulder, CO, United States) Datta, Rahul (Michigan Univ. Ann Arbor, MI, United States) Duff, Shannon M. (National Inst. of Standards and Technology Boulder, CO, United States) Gallardo, Patricia A. (Cornell Univ. Ithaca, NY, United States) Hasselfield, Matthew (Pennsylvania State Univ. University Park, PA, United States) Henderson, Shawn W. (Cornell Univ. Ithaca, NY, United States) Wollack, Edward J. (NASA Goddard Space Flight Center Greenbelt, MD United States) Date Acquired
March 29, 2017
Publication Date
June 26, 2016
Publication Information
Publication: SPIE Proceedings
Publisher: SPIE
Volume: 9914
Meeting Information
Meeting: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference 2016
Location: Edinburgh
Country: United Kingdom
Start Date: June 26, 2016
Sponsors: International Society for Optical Engineering
Distribution Limits
Public