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x-ray spectro-polarimetry with photoelectric polarimetersWe derive a generalization of forward fitting for X-ray spectroscopy to include linear polarization of X-ray sources, appropriate for the anticipated next generation of space-based photoelectric polarimeters. We show that the inclusion of polarization sensitivity requires joint fitting to three observed spectra, one for each of the Stokes parameters, I(E), U(E), and Q(E). The equations for StokesI (E) (the total intensity spectrum) are identical to the familiar case with no polarization sensitivity, and for which the model-predicted spectrum is obtained by a convolution of the source spectrum, F (E), with the familiar energy response function,(E) R(E,E), where (E) and R(E,E) are the effective area and energy redistribution matrix, respectively. In addition to the energy spectrum, the two new relations for U(E) and Q(E) include the source polarization fraction and position angle versus energy, a(E), and 0(E), respectively, and the model-predicted spectra for these relations are obtained by a convolution with the modulated energy response function, (E)(E) R(E,E), where(E) is the energy-dependent modulation fraction that quantifies a polarimeters angular response to 100 polarized radiation. We present results of simulations with response parameters appropriate for the proposed PRAXyS Small Explorer observatory to illustrate the procedures and methods, and we discuss some aspects of photoelectric polarimeters with relevance to understanding their calibration and operation.
Document ID
20170003480
Document Type
Reprint (Version printed in journal)
Authors
Strohmayer, T. E.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
April 14, 2017
Publication Date
March 20, 2017
Publication Information
Publication: The Astrophysical Journal
Volume: 838
Issue: 1
ISSN: 0004-637X
Subject Category
Astrophysics
Numerical Analysis
Report/Patent Number
GSFC-E-DAA-TN41421
Distribution Limits
Public
Copyright
Other
Keywords
polarization
methods: data analysis
techniques: polarimetrics
X-rays: general