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Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight CenterTotal ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.
Document ID
20170004127
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Campola, Michael J.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Cochran, Donna J.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Alt, Shannon
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Boutte, Alvin J.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Chen, Dakai
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Gigliuto, Robert A.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, Jonathan A.
(NASA Headquarters Washington, DC United States)
Ladbury, Raymond L.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Casey, Megan C.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Wilcox, Edward P.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
O'Bryan, Martha V.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Lauenstein, Jean-Marie
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Xapsos, Michael A.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
May 1, 2017
Publication Date
July 11, 2016
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN35505
GSFC-E-DAA-TN46002
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: Portland, OR
Country: United States
Start Date: July 11, 2016
End Date: July 15, 2016
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
and Total Ionizing Dose
Displacement Damage
Optoelectronics
Proton Damage
Total Ionizing Dose (TID)
Optoelectronics
Single Event Effects
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