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Compendium of Single Event Effects Test Results for Commercial Off-The-Shelf and Standard Electronics for Low Earth Orbit and Deep Space ApplicationsWe present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.
Document ID
20170006885
Acquisition Source
Johnson Space Center
Document Type
Presentation
Authors
Reddell, Brandon D. (NASA Johnson Space Center Houston, TX, United States)
Bailey, Charles R. (NASA Johnson Space Center Houston, TX, United States)
Nguyen, Kyson V. (Jacobs Technology, Inc. Houston, TX, United States)
O'Neill, Patrick M. (NASA Johnson Space Center Houston, TX, United States)
Wheeler, Scott (Lockheed Martin Corp. Houston, TX, United States)
Gaza, Razvan (Lockheed Martin Corp. Denver, CO, United States)
Cooper, Jaime (Lockheed Martin Corp. Denver, CO, United States)
Kalb, Theodore (Lockheed Martin Corp. Denver, CO, United States)
Patel, Chirag (Lockheed Martin Corp. Denver, CO, United States)
Beach, Elden R. (Lockheed Martin Corp. Denver, CO, United States)
Mason, Larry (Lockheed Martin Corp. Denver, CO, United States)
Date Acquired
July 20, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering
Spacecraft Instrumentation And Astrionics
Report/Patent Number
JSC-CN-39821-2
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects Conference
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.

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