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Demonstration of Long Vacuum Integrity Lifetime of Trapped Ion Standard PackageA compact Hg ion trap package that was vacuum-sealed since 9 years has been demonstrated to be successfully operational showing excellent ion-trap lifetime exceeding 400 days. In addition to the vacuum package, the same 9-year old optical and detection packages are utilized to obtain these results. Charge transfer relaxation effects between neutral Hg and trapped Hg ion are studied. This work shows the reliability of such units in view of next-generation ground and space-borne trapped ion clocks.
Document ID
20170007021
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/45728
Authors
Bandi, Trejesh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Prestage, John (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Chung, Sang (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Le, Thanh (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Yu, Nan (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 1, 2017
Publication Date
April 12, 2015
Subject Category
Metals And Metallic Materials
Meeting Information
Meeting: 2015 Joint Conference of the IEEE IFCS and EFTF
Location: Denver, CO
Country: United States
Start Date: April 12, 2015
End Date: April 16, 2015
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other
Keywords
charge-transfer relaxation
Hg clock
long shelf-life
Ultra-High Vacuum (UHV)

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