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In-Situ Stress Measurement of Single and Multilayer Films for X-Ray Astronomy Optical ApplicationsNo abstract available
Document ID
20170007744
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Broadway, D. (NASA Marshall Space Flight Center Huntsville, AL United States)
Ramsey, B. (NASA Marshall Space Flight Center Huntsville, AL United States)
O'Dell, S. (NASA Marshall Space Flight Center Huntsville, AL United States)
Gurgew, D. (Alabama Univ. Huntsville, AL, United States)
Date Acquired
August 16, 2017
Publication Date
August 6, 2017
Subject Category
Optics
Report/Patent Number
MSFC-E-DAA-TN45754
Meeting Information
Meeting: SPIE Optics + Photonics 2017
Location: San Diego, CA
Country: United States
Start Date: August 6, 2017
End Date: August 10, 2017
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
in-situ stress measurement

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