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Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging ProgramWe present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Document ID
20170008448
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
O'Bryan, Martha V.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, Jonathan Allen
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Berg, Melanie D.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Wilcox, Edward Palmer
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Chen, Dakai
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Campola, Michael Joseph
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Casey, Megan Colleen
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Lauenstein, Jean-Marie
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Guertin, Steven Michael
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Wyrwas, Edward J.
(Lentech, Inc. Albuquerque, NM, United States)
Date Acquired
September 1, 2017
Publication Date
July 17, 2017
Subject Category
Spacecraft Design, Testing And Performance
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN44942
Meeting Information
Meeting: 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017)
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Single Event Effects (SEE); space radiation reliability; spacecraft electronics
spacecraft electronics
space radiation reliability
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