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Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging ProgramTotal ionizing dose and displacement damage testing was performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices. Displacement Damage, Optoelectronics, Proton Damage, Single Event Effects, and Total Ionizing Dose.
Document ID
20170008999
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Topper, Alyson D. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Campola, Michael J. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Chen, Dakai (Analog Devices IMI, Inc. Berkeley, CA, United States)
Casey, Megan C. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Yau, Ka-Yen (ASRC Federal Space and Defense Greenbelt, MD, United States)
Cochran, Donna J. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Label, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Ladbury, Raymond L. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Mondy, Timothy K. (NASA Goddard Space Flight Center Greenbelt, MD United States)
O'Bryan, Martha V. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Pellish, Jonathan A. (NASA Headquarters Washington, DC United States)
Wilcox, Edward P. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Wyrwas, Edward (Lentech, Inc. Greenbelt, MD, United States)
Xapsos, Michael A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
September 26, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN45573
Meeting Information
Meeting: 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017)
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Proton Damage
and Total Ionizing Dose.
Displacement Damage
Single Event Effects
Optoelectronics

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