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Heavy Ion Test Report for the AD9257-EP Analog-to-Digital ConverterThe purpose of this test campaign is to determine the heavy ion-induced single-event effect (SEE) susceptibility of the AD9257-EP from Analog Devices.
Document ID
20170009003
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Chen, Dakai (NASA Goddard Space Flight Center Greenbelt, MD United States)
Kim, Hak (ASRC Federal Space and Defense Greenbelt, MD, United States)
Feizi, Ali (AK Aerospace Technology Corp. Potomac, MD, United States)
Wilcox, Ted (ASRC Federal Space and Defense Greenbelt, MD, United States)
Seidleck, Christina (ASRC Federal Space and Defense Greenbelt, MD, United States)
Phan, Anthony (ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
September 26, 2017
Publication Date
September 20, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN44751
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
single event upsets (SEU)
single-event effect (SEE)
analog-to-digital converter (ADC)

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