Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD, United States) Casey, Megan (NASA Goddard Space Flight Center Greenbelt, MD, United States) Date Acquired
November 14, 2017
Publication Date
January 1, 2017
Subject Category
Electronics And Electrical EngineeringSpace Radiation Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
Power semiconductor devices single-event effects Silicon carbide SEB JFETs SEESingle-event burnout MOSFET Heavy-Ion radiation effects Schottky diodes