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X-Ray Optical Thin Film Deposition and Analysis Capability at NASA MSFC
NTRS Full-Text: Click to View  [PDF Size: 3.2 MB]
Author and Affiliation:
Broadway, D.(NASA Marshall Space Flight Center, Huntsville, AL, United States)
Abstract: No abstract available
Publication Date: Nov 14, 2017
Document ID:
20170011231
(Acquired Dec 05, 2017)
Subject Category: OPTICS
Report/Patent Number: MSFC-E-DAA-TN49196
Document Type: Oral/Visual Presentation
Meeting Information: Mirror Technology SBIR/STTR Workshop; 14-16 Nov. 2017; Redondo Beach, CA; United States
Meeting Sponsor: International Society for Optical Engineering; Bellingham, WA, United States
Financial Sponsor: NASA Marshall Space Flight Center; Huntsville, AL, United States
Organization Source: NASA Marshall Space Flight Center; Huntsville, AL, United States
Description: 27p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright; Work of the U.S. Government - Public use permitted
NASA Terms: THIN FILMS; X RAY OPTICS; DEPOSITION; OPTICAL MATERIALS; IN SITU MEASUREMENT; STRESS MEASUREMENT; FIBER OPTICS; REFLECTOMETERS; POLYCRYSTALS; ARGON; CRITICAL PRESSURE; SENSITIVITY ANALYSIS; DISPLACEMENT; LAMINATES
Other Descriptors: IN-SITU STRS
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