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Single-Event Effect Testing of the Linear Technology LTC6103HMS8#PBF Current Sense Amplifier
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Author and Affiliation:
Yau, Ka-Yen(ASRC Federal Space and Defense, Greenbelt, MD, United States)
Campola, Michael J.(NASA Goddard Space Flight Center, Greenbelt, MD, United States)
Wilcox, Edward(ASRC Federal Space and Defense, Greenbelt, MD, United States)
Abstract: The LTC6103HMS8#PBF (henceforth abbreviated as LTC6103) current sense amplifier from Linear Technology was tested for both destructive and non-destructive single-event effects (SEE) using the heavy-ion cyclotron accelerator beam at Lawrence Berkeley National Laboratory (LBNL) Berkeley Accelerator Effects (BASE) facility. During testing, the input voltages and output currents were monitored to detect single event latch-up (SEL) and single-event transients (SETs).
Publication Date: Aug 18, 2016
Document ID:
20170011694
(Acquired Dec 14, 2017)
Subject Category: ELECTRONICS AND ELECTRICAL ENGINEERING
Report/Patent Number: GSFC-E-DAA-TN48599
Document Type: Technical Report
Contract/Grant/Task Num: NNG13CR48C
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD, United States
Organization Source: NASA Goddard Space Flight Center; Greenbelt, MD, United States
Description: 9p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright; Use by or on behalf of the U.S. Government permitted
NASA Terms: CURRENT AMPLIFIERS; SINGLE EVENT UPSETS; ELECTRIC POTENTIAL; HIGH VOLTAGES; HEAVY IONS; ION CYCLOTRON RADIATION; DESTRUCTION; LATCH-UP; IRRADIATION
Other Descriptors: SINGLE-EVENT EFFECTS (SEE); SINGLE EVENT LATCH-UP (SEL); SINGLE-EVENT TRANSIENTS (SETS
Miscellaneous Notes: For release in the NASA Electronic Parts and Packaging (NEPP) Public Website:nepp.nasa.gov
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Last Modified: December 14, 2017
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