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High-Resolution Monitoring for Thermal Remediation OptimizationAbstract is in response to call for abstracts for Battelle Chlorinated Solvent Conference. The abstract discusses how we conducted high-resolution monitoring for thermal remediation optimization.
Document ID
20180002383
Acquisition Source
Kennedy Space Center
Document Type
Conference Paper
Authors
Chrest, Anne M. (NASA Kennedy Space Center Cocoa Beach, FL, United States)
Hook, Christopher A. (Tetra Tech, Inc. Kennedy Space Center, FL, United States)
Davis, Robert F. (Tetra Tech, Inc. Kennedy Space Center, FL, United States)
Pike, Christopher J. (Tetra Tech, Inc. Kennedy Space Center, FL, United States)
Speranza, Mark P. (Tetra Tech, Inc. Kennedy Space Center, FL, United States)
Date Acquired
April 11, 2018
Publication Date
April 8, 2018
Subject Category
Chemistry And Materials (General)
Environment Pollution
Report/Patent Number
KSC-E-DAA-TN46046
Meeting Information
Meeting: International Conference on Remediation of Chlorinated and Recalcitrant Compounds
Location: Palm Springs, CA
Country: United States
Start Date: April 8, 2018
End Date: April 12, 2018
Sponsors: Battelle Memorial Inst.
Funding Number(s)
CONTRACT_GRANT: NNK12CA15B
Distribution Limits
Public
Copyright
Public Use Permitted.

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