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COTS 3D NAND Flash: SEE Test Results and ChallengesHeavy-ion test data for 3D NAND flash memories is presented, along with a discussion of modern testing challenges and near-term plans for a broad survey of currently-available product lines.
Document ID
20180003142
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
External Source(s)
https://nepp.nasa.gov/
Authors
Wilcox, Edward (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
May 29, 2018
Publication Date
May 21, 2018
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN56695
GSFC-E-DAA-TN66182
Meeting Information
Meeting: 2018 Single Event Effects (SEE) Symposium
Location: San Diego, CA
Country: United States
Start Date: May 21, 2018
End Date: May 24, 2018
Sponsors: NASA Headquarters
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Technical Review
Single Expert
Keywords
Flash memory
Single-Event Effects (SEE)
Commercial-off-the-shelf (COTS)

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