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Effects of Sample Holder Edge Geometry on Atomic Oxygen Erosion Yield of Pyrolytic Graphite Exposed in Low Earth OrbitThe measurement of the erosion yield (volume lost per incident atom) of polymers and carbon using low Earth orbital (LEO) atomic oxygen exposure has typically involved placing small samples in holders that have chamfered edges. The chamfered edges have sometimes cause the samples to tear by their perimeters. This paper reports an evaluation of the erosion profile of a LEO atomic oxygen exposed pyrolytic graphite sample to determine the extent to which the erosion yield is altered by the chamfer and what the expected erosion yield would be for large area samples. The results indicate that the durability of large area samples would be approx. 5.2% lower than predicted based on mass loss of small samples with exposed diameters of 0.838 inch (2.13 cm) and chamfered sample holders.
Document ID
20180003527
Document Type
Technical Memorandum (TM)
Authors
Banks, Bruce A. (Science Applications International Corp. (SAIC) Cleveland, OH, United States)
Miller, Sharon K. (NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
June 13, 2018
Publication Date
May 1, 2018
Subject Category
Nonmetallic Materials
Report/Patent Number
NASA/TM-2018-219910
GRC-E-DAA-TN54862
E-19526
Funding Number(s)
WBS: WBS 291647.01.22
CONTRACT_GRANT: NNC12BA01B
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
erosion yield
Atomic oxygen

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