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Energy Analysis Method for Hidden Damage DetectionA method of detecting internal defects in composites or other multilayer materials includes generating a wavefield on a surface of the material. Wavefield data is collected from the wavefield on the surface, and the measured wavefield data is processed to provide measured energy data. The method may include generating simulated or predicted energy data for the multilayer material that is compared to the simulated energy data to determine if the multilayer material has internal defects or damage below the surface. The method can be utilized to detect and/or quantify damage or other defects that are "hidden" by damage that is closer to the surface of the material.
Document ID
20180004302
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Campbell Leckey, Cara A.
Date Acquired
August 9, 2018
Publication Date
June 26, 2018
Subject Category
Composite Materials
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-10,006,886
Patent Application
US-Patent-Appl-SN-14/709,887
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