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Planetary Crater Detection and Registration Using Marked Point Processes, Multiple Birth and Death Algorithms, and Region-Based AnalysisBecause of the large variety of sensors and spacecraft collecting data, planetary science needs to integrate various multi-sensor and multi-temporal images. These multiple data represent a precious asset, as they allow the study of targets spectral responses and of changes in the surface structure; because of their variety, they also require accurate and robust registration. A new crater detection algorithm, used to extract features that will be integrated in an image registration framework, is presented. A marked point process-based method has been developed to model the spatial distribution of elliptical objects (i.e. the craters) and a birth-death Markov chain Monte Carlo method, coupled with a region-based scheme aiming at computational efficiency, is used to find the optimal configuration fitting the image. The extracted features are exploited, together with a newly defined fitness function based on a modified Hausdorff distance, by an image registration algorithm whose architecture has been designed to minimize the computational time.
Document ID
20180004557
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Solarna, David
(Genoa Univ. Genoa, Italy)
Moser, Gabriele
(Genoa Univ. Genoa, Italy)
Le Moigne, Jacqueline
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Serpico, Sebastiano B.
(Genoa Univ. Genoa, Italy)
Date Acquired
August 20, 2018
Publication Date
July 23, 2018
Subject Category
Statistics And Probability
Report/Patent Number
GSFC-E-DAA-TN42854
Report Number: GSFC-E-DAA-TN42854
Meeting Information
Meeting: IEEE International Geoscience and Remote Sensing Symposium (IGARSS) 2017
Location: Fort Worth, TX
Country: United States
Start Date: July 23, 2017
End Date: July 28, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
Keywords
Image Processing:Pattern Recognition
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