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System and Method of Optical Axis Alignment Monitor and Feedback Control for a SpectrometerThe present invention relates to an apparatus and method of a real-time, monitoring and control feedback system for a 2-D spectrometer application, to correct for active optical axis pointing misalignments or jitter (i.e., tip, tilt), that result in degraded scientific image integrity, unwanted spatial crosstalk and image blurring artifacts which severely limit the applications for high resolution spectrometer image data. The present invention provides a unique system architecture which ensures the most direct optical axis motion detection and control capability that will enable sub-pixel image motion monitoring and boresight control stability, thus, maximizing the science image quality.
Document ID
20180008169
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Marx, Catherine
Linares, Irving
Shu, Peter
Smith, James
Date Acquired
December 5, 2018
Publication Date
October 30, 2018
Subject Category
Instrumentation And Photography
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-10,113,908
Patent Application
US-Patent-Appl-SN-15/714,568
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