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Method and System for Multi-Path Active Defect Detection, Localization and Characterization with Ultrasonic Guided WavesA method and system of detecting, localizing, and characterizing a defect at one or more spatial points of interest on a structure. The method may include collecting first data in a first state using one or more transducers on the structure, collecting second data in a second state subsequent to the first state, computing a scattered impulse response based on the collected first data and the collected second data, comparing the scattered impulse response with an estimated scattered impulse response corresponding to the case when damage is present at one or more spatial points of interest on the structure, and combining the generated comparison results to detect, localize, and characterize a defect at the one or more spatial points of interest on the structure.
Document ID
20190000745
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Hall, James Stroman
Michaels, Jennifer Emmons
Date Acquired
February 14, 2019
Publication Date
November 13, 2018
Subject Category
Acoustics
Electronics And Electrical Engineering
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-14/396,373
Patent Number: US-Patent-10,126,274
Funding Number(s)
CONTRACT_GRANT: NNX12CF12P
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-10,126,274
Patent Application
US-Patent-Appl-SN-14/396,373
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