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Thermal Testing of the Heatshield for Extreme Entry Environment Technology (HEEET) TPSThe testing of a thermal protection system (TPS) in multiple arc jets and laser facilities is critical not only to determine the ability of a material to withstand the harsh aerothermal environments but is also required to collect relevant data that allows construction of a thermal response model of the TPS for flight design. The present talk provides an overview of recent arcjet testing of the HEEET material, one of the families of materials from the 3D Woven TPS program, being developed under NASAs Heatshield for Extreme Entry Environment Technology (HEEET) project.
Document ID
20190001128
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Gasch, M,
(NASA Ames Research Center Moffett Field, CA, United States)
Stackpoole, M.
(NASA Ames Research Center Moffett Field, CA, United States)
Gonzales, G.
(Engineering Research and Consulting (ERC), Inc. Moffett Field, CA, United States)
Prabhu, D.
(Engineering Research and Consulting (ERC), Inc. Moffett Field, CA, United States)
Ellerby, D.
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
March 4, 2019
Publication Date
June 15, 2015
Subject Category
Engineering (General)
Spacecraft Design, Testing And Performance
Report/Patent Number
ARC-E-DAA-TN21545
Meeting Information
Meeting: International Planetary Probe Workshop (IPPW 2015)
Location: Cologne
Country: Germany
Start Date: June 15, 2015
End Date: June 19, 2015
Sponsors: Lunar and Planetary Institute
Funding Number(s)
CONTRACT_GRANT: NNA10DE12C
WBS: WBS 542669.04.01.03
Distribution Limits
Public
Copyright
Public Use Permitted.
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