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ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test ReportThe purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation for total dose response. This test’s purpose is to evaluate and compare lot date codes for sensitivity. In the test, the device is exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits or addresses, and overall chip and die health are investigated to determine which lot is more robust. These parameters directly affect the functionality of the memory within a system and may determine thresholds necessary to mitigate failure.
Document ID
20190001289
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Wyrwas, Edward J.
(Science Systems and Applications, Inc. Lanham, MD, United States)
Kim, Hak S.
(Science Systems and Applications, Inc. Lanham, MD, United States)
Campola, Michael J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
March 7, 2019
Publication Date
March 4, 2019
Subject Category
Aerospace Medicine
Report/Patent Number
GSFC-E-DAA-TN65272
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Total Ionizing Dose (TID)
NASA Electronic Parts and Packaging (NEPP) Program
Double Data Rate (DDR)
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