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Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test ReportThe goal of this study was to perform an independent investigation of single event destructive and transient susceptibility of the Microsemi RTG4 device. The devices under test were the Microsemi RTG4 field programmable gate array (FPGA) Rev C. The devices under test will be referenced as the DUT or RTG4 Rev C throughout this document. The DUT was configured to have various test structures that are geared to measure specific potential susceptibilities of the device. DesignDevice susceptibility was determined by monitoring the DUT for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) was checked throughout heavy-ion testing by monitoring device current.
Document ID
20190001593
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Berg, Melanie D.
(Science Systems and Applications, Inc. Lanham, MD, United States)
Kim, Hak
(Science Systems and Applications, Inc. Lanham, MD, United States)
Phan, Anthony
(Science Systems and Applications, Inc. Lanham, MD, United States)
Seidleck, Christina
(Science Systems and Applications, Inc. Lanham, MD, United States)
Label, Ken
(Science Systems and Applications, Inc. Lanham, MD, United States)
Pellish, Jonny
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Campola, Michael
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
March 18, 2019
Publication Date
March 15, 2019
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN44754
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Field Programmable Gate Array (FPGA)
Heavy-ion Testing
Single Event Effects (SEE)
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