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Overview of Phobos/Deimos Regolith Ion Sample Mission (PRISM) ConceptFar more definitive information on composition is required to resolve the question of origin for the Martian moons Phobos and Deimos. Current infrared spectra of the objects are inconclusive due to the lack of strong diagnostic features.Definitive compositional measurements of Phobos could be obtained using in-situ X-ray, gamma-ray, or neutronspectroscopy or collecting and returning samples to Earth for analysis. We have proposed, in lieu of those methods, toderive Phobos and Deimos compositional data from secondary ion mass spectrometry (SIMS) measurements by calibratingthe instrument to elemental abundance measurements made for known samples in the laboratory. We describe thePhobos/Deimos Regolith Ion Sample Mission (PRISM) concept here. PRISM utilizes a high-resolution TOF plasma composition analyzer to make SIMS measurements by observing the sputtered species from various locations of the moons' surfaces. In general, the SIMS technique and ion mass spectrometers complement and expand quadrupole mass spectrometer measurements by collecting ions that have been energized to higher energies, 50-100 eV, and making measurements at very low densities and pressures. Furthermore, because the TOF technique accepts all masses all the time,it obtains continuous measurements and does not require stepping through masses. The instrument would draw less than10 W and weigh less than 5 kg. The spacecraft, nominally a radiation-hardened 12U CubeSat, would use a low-thrust SolarElectric Propulsion system to send it on a two-year journey to Mars, where it would co-orbit with Deimos and then Phobos
Document ID
20190001663
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
External Source(s)
Authors
Clark, Pamela
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Collier, Michael
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Schaible, Micah
(Georgia Inst. of Technology Atlanta, GA, United States)
Farrell, William M.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Folta, David
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Hughes, Kyle M.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Keller, John W.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Malphrus, Ben
(Morehead State Univ. Morehead, KY, United States)
Rivkin, Andrew S.
(Johns Hopkins Univ. Laurel, MD, United States)
Murchie, Scott
(Johns Hopkins Univ. Laurel, MD, United States)
Hurley, Dana
(Johns Hopkins Univ. Laurel, MD, United States)
Halekas, Jasper
(Iowa Univ. Iowa City, IA, United States)
Vondrak, Richard
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Stubbs, Timothy
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Killen, Rosemary
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sarantos, Menelaos
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Jones, Sarah L.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Espley, Jared
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Dibraccio, Gina
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
March 20, 2019
Publication Date
September 18, 2018
Publication Information
Publication: Proceedings of SPIE - The International Society for Optical Engineering. CubeSats and NanoSats for Remote Sensing II
Publisher: SPIE
Volume: 10769
ISSN: 0277-786X
e-ISSN: 1996-756X
Subject Category
Lunar And Planetary Science And Exploration
Report/Patent Number
GSFC-E-DAA-TN66044
Meeting Information
Meeting: SPIE Optical Engineering + Applications, 2018
Location: San Diego, CA
Country: United States
Start Date: August 18, 2018
End Date: August 23, 2018
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
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