NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
A New Approach to System-Level Single Event Survivability PredictionWe are investigating the application of classical reliability performance metrics combined with standard single event upset (SEU) analysis data to improve system survivability prediction.
Document ID
20190002701
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
External Source(s)
https://nepp.nasa.gov/
Authors
Berg, Melanie (Science Systems and Applications, Inc. Lanham, MD, United States)
LaBel, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Xapsos, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
April 23, 2019
Publication Date
February 6, 2018
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN65832
GSFC-E-DAA-TN52345
Meeting Information
Meeting: Microelectronics Reliability & Qualification Working Meeting (MRQW)
Location: El Segundo, CA
Country: United States
Start Date: February 6, 2018
End Date: February 8, 2018
Sponsors: Aerospace Corp.
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
Single event upset (SEU)
Field programmable gate array (FPGA)
NASA Electronic Parts and Packaging (NEPP) Program

Related Records

There are no records associated with this record.
No Preview Available