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Winter Wheat Yield Assessment from Landsat 8 and Sentinel-2 Data: Incorporating Surface Reflectance, Through Phenological Fitting, into Regression Yield ModelsA combination of Landsat 8 and Sentinel-2 offers a high frequency of observations (3–5 days) at moderate spatial resolution (10–30 m), which is essential for crop yield studies. Existing methods traditionally apply vegetation indices (VIs) that incorporate surface reflectances (SRs) in two or more spectral bands into a single variable, and rarely address the incorporation of SRs into empirical regression models of crop yield. In this work, we address these issues by normalizing satellite data (both VIs and SRs) derived from NASA’s Harmonized Landsat Sentinel-2 (HLS) product, through a phenological fitting. We apply a quadratic function to fit VIs or SRs against accumulated growing degree days (AGDDs), which affects the rate of crop development. The derived phenological metrics for VIs and SRs, namely peak, area under curve (AUC), and fitting coefficients from a quadratic function, were used to build empirical regression winter wheat models at a regional scale in Ukraine for three years, 2016–2018. The best results were achieved for the model with near infrared (NIR) and red spectral bands and derived AUC, constant, linear, and quadratic coefficients of the quadratic model. The best model yielded a root mean square error (RMSE) of 0.201 t/ha (5.4%) and coefficient of determination R2 = 0.73 on cross-validation.
Document ID
20190029645
Acquisition Source
Goddard Space Flight Center
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Skakun, Sergii ORCID
(Maryland Univ. College Park, MD, United States)
Vermote, Eric
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Franch, Belen
(Maryland Univ. College Park, MD, United States)
Roger, Jean-Claude ORCID
(Maryland Univ. College Park, MD, United States)
Kussul, Nataliia
(Institute of Space Research Lviv, Ukraine)
Ju, Junchang
(Maryland Univ. College Park, MD, United States)
Masek, Jeffrey
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 26, 2019
Publication Date
July 27, 2019
Publication Information
Publication: Remote Sensing
Publisher: MDPI
Volume: 11
Issue: 15
ISSN: 2072-4292
e-ISSN: 2072-4292
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
GSFC-E-DAA-TN72270
Funding Number(s)
CONTRACT_GRANT: 80NSSC18K0336
CONTRACT_GRANT: 80NSSC18M0039
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
Technical Review
Single Expert
Keywords
phenological fitting
crop yield
growingdegree days (GDD)
Landsat 8
HLS
Sentinel-2
agriculture
wheat
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