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Refractive Index of Polyaryletherketone (PEEK) at X- and W-BandThis report details refractive index measurements of polyaryletherketone (PEEK) thermoplastic between X-band (8 to 12 GHz) and W-band (75 to 110 GHz) frequencies. Scattering-parameter data are collected using both traditional waveguide and modified free-space techniques. The complex-valued refractive index is calculated using the standard Nicolson-Ross-Weir method. Results indicate that PEEK’s refractive index is n = 1.783 – 0.001i across X-band and n = 1.792 – 0.007i across W-band. Therefore, PEEK exhibits a moderate real refractive index component and low transmission loss. Coupled with its favorable mechanical and thermal properties, this makes PEEK an ideal material to inspect using NASA’s submillimeter radiofrequency-based technology.
Document ID
20190032501
Acquisition Source
Glenn Research Center
Document Type
Technical Memorandum (TM)
Authors
Schemmel, Peter J.
(NASA Glenn Research Center Cleveland, OH, United States)
Lambert, Kevin M.
(Vantage Partners, LLC Brook Park, OH, United States)
Date Acquired
November 5, 2019
Publication Date
October 1, 2019
Subject Category
Nonmetallic Materials
Report/Patent Number
NASA/TM-2019-220223
GRC-E-DAA-TN69284
E-19709
Funding Number(s)
WBS: 109492.02.03.02.20.01
CONTRACT_GRANT: NNC12BA01B
Distribution Limits
Public
Copyright
Public Use Permitted.
Technical Review
Single Expert
Keywords
Polyaryletherketone
Refractive Index
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