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Operation of Ultrafast, Low-Side MOSFET Driver, IXD609, over Wide Temperature RangeElectrical power and control systems designed for use in planetary exploration missions and deep space probes require electronics that are capable of efficient and reliable operation under extreme temperature conditions. In addition, space-based infrared satellites, all-electric ships, jet engines, electromagnetic launchers, magnetic levitation transport systems, and power facilities are also typical examples where system electronics are expected to be exposed to harsh temperatures and to operate under severe thermal swings. Most commercial-off-the-shelf (COTS) devices are not designed to function under such extreme conditions and very little data exist on their performance outside their specified range of operation. In this work, the performance of an ultrafast gate driver for controlling power-level transistors was evaluated under extreme temperatures and thermal cycling. The investigations were carried out to assess performance for potential use of this device in space exploration missions under extreme temperature conditions.



Document ID
20190032515
Document Type
Other
Authors
Boomer, Kristen (NASA Glenn Research Center Cleveland, OH, United States)
Hammoud, Ahmad (Vantage Partners, LLC Brook Park, OH, United States)
Date Acquired
November 5, 2019
Publication Date
January 1, 2019
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
GRC-E-DAA-TN73724
Funding Number(s)
CONTRACT_GRANT: NNC12BA01B
WBS: 724297.40.49.03.01
Distribution Limits
Public
Copyright
Public Use Permitted.

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