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Performance Evaluation of Isolated Gate Driver, ADuM4121, Under Exposure to Extreme TemperatureElectronics designed for use in space missions are expected to be exposed to harsh environment including radiation and extreme temperature, to name a few. Severe thermal swings are also encountered depending on planetary exploration, orbital orientation, and mission duration. Most commercial-off-the-shelf (COTS) devices are not designed to function under such extreme conditions and very little data exist on their performance outside their specified range of operation. In this work, the performance of an isolated gate driver for controlling power-level transistors, including gallium nitride (GaN) and silicon carbide (SiC) devices, was evaluated under extreme temperatures and thermal cycling. The investigations were carried out to assess performance for potential use of this device in space exploration missions under extreme temperature conditions.



Document ID
20200002261
Document Type
Other
Authors
Boomer, Kristen (NASA Glenn Research Center Cleveland, OH, United States)
Hammoud, Ahmad (HX5 Sierra, LLC Cleveland, OH, United States)
Date Acquired
April 7, 2020
Publication Date
April 1, 2020
Subject Category
Electronics and Electrical Engineering
Report/Patent Number
GRC-E-DAA-TN78999
Funding Number(s)
WBS: 724297.40.49.03.01
CONTRACT_GRANT: NNC12BA01B
Distribution Limits
Public
Copyright
Public Use Permitted.

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