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Development of design criteria and a qualification test for bypass diodesThe development of a qualification test for modules bypass diodes is reviewed. Diode junction temperature is measured, indirectly, under laboratory ambient conditions, and extrapolated to field conditions. Criteria are given for diode reliability.
Document ID
19860019930
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Otth, D. H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 12, 2013
Publication Date
June 1, 1985
Publication Information
Publication: Proceedings of the 25th Project Integration Meeting
Subject Category
Energy Production And Conversion
Accession Number
86N29402
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19860019875Collected WorksProceedings of the 25th Project Integration Meeting
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