NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Fully-depleted silicon-on-sapphire and its application to advanced VLSI designIn addition to the widely recognized advantages of full dielectric isolation, e.g., reduced parasitic capacitance, transient radiation hardness, and processing simplicity, fully-depleted silicon-on-sapphire offers reduced floating body effects and improved thermal characteristics when compared to other silicon-on-insulator technologies. The properties of this technology and its potential impact on advanced VLSI circuitry will be discussed.
Document ID
19940017236
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Offord, Bruce W.
(Naval Ocean Systems Center San Diego, CA, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1992
Publication Information
Publication: Idaho Univ., The 1992 4th NASA SERC Symposium on VLSI Design
Subject Category
Electronics And Electrical Engineering
Accession Number
94N21709
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available