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Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary DataThis is a NASA Electronics Parts and Packaging (NEPP) independent investigation to determine the single event destructive and transient susceptibility of the Microsemi RTG4 device (DUT).
Document ID
20160008697
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
Kim, Hak (ASRC Federal Space and Defense Greenbelt, MD, United States)
Phan, Anthony (ASRC Federal Space and Defense Greenbelt, MD, United States)
Seidleck, Christina (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Ken (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
July 5, 2016
Publication Date
June 26, 2016
Subject Category
Electronics And Electrical Engineering
Quality Assurance And Reliability
Report/Patent Number
GSFC-E-DAA-TN32694
Meeting Information
Meeting: Annual Single Event Effects (SEE) Symposium
Location: San Diego, CA
Country: United States
Start Date: May 23, 2016
End Date: May 26, 2016
Sponsors: Naval Research Lab., NASA Headquarters, See Symposium (Single Event Effects)
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
single event transients (SETs)
Microsemi RTG4
Field programmable gate array (FPGA)
Single Event Effects (SEEs)
heavy ion

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