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International Space Station Alpha trace contaminant control subassembly life test reportThe Environmental Control and Life Support System (ECLSS) Life Test Program (ELTP) began with Trace Contaminant Control Subassembly (TCCS) Life Testing on November 9, 1992, at 0745. The purpose of the test, as stated in the NASA document 'Requirements for Trace Contaminant Control Subassembly High Temperature Catalytic Oxidizer Life Testing (Revision A)' was to 'provide for the long duration operation of the ECLSS TCCS HTCO (High Temperature Catalytic Oxidizer) at normal operating conditions... (and thus)... to determine the useful life of ECLSS hardware for use on long duration manned space missions.' Specifically, the test was designed to demonstrate thermal stability of the HTCO catalyst. The report details TCCS stability throughout the test. Graphs are included to aid in evaluating trends and subsystem anomalies. The report summarizes activities through the final day of testing, January 17, 1995 (test day 762).
Document ID
19950019944
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Tatara, J. D.
(ION Electronics Hunsville, AL., United States)
Perry, J. L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1995
Subject Category
Man/System Technology And Life Support
Report/Patent Number
NASA-TM-108488
NAS 1.15:108488
Accession Number
95N26364
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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