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Humidity Steady State Low Voltage Testing of MLCCs (Based on NESC Technical Assessment Report)Review of the low voltage reduced Insulation Resistance (IR) failure phenomenon in Multilayer ceramic capacitors (MLCCs)and NASA approaches to contend with this risk. 1. Analyze published materials on root cause mechanisms. 2. Investigate suitability of current test methods to assess MLCC lots for susceptibility. 3. Review current NASA parts selection and application guidelines in consideration of benefits vs. disadvantages.
Document ID
20110015296
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Sampson, Mike (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Brusse, Jay (Dell Perot Systems Greenbelt, MD, United States)
Teverovsky, Alexander (Dell Perot Systems Greenbelt, MD, United States)
Date Acquired
August 25, 2013
Publication Date
March 28, 2011
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC.CPR.4863.2011
Meeting Information
Meeting: Capacitors and Resistors Technology Symposium (CARTS)
Location: Jacksonville, FL
Country: United States
Start Date: March 28, 2011
End Date: March 31, 2011
Distribution Limits
Public
Copyright
Public Use Permitted.

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