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A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate ArraysWe present a novel method of FPGA TID testing that measures propagation delay between flip-flops operating at maximum speed. Measurement is performed on-chip at-speed and provides a key design metric when building system-critical synchronous designs.
Document ID
20120009206
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Wilcox, Edward (MEI Technologies, Inc. Greenbelt, MD, United States)
Berg, Melanie (MEI Technologies, Inc. Greenbelt, MD, United States)
Friendlich, Mark (MEI Technologies, Inc. Greenbelt, MD, United States)
Lakeman, Joseph (MEI Technologies, Inc. Greenbelt, MD, United States)
KIm, Hak (MEI Technologies, Inc. Greenbelt, MD, United States)
Pellish, Jonathan (NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 25, 2013
Publication Date
July 16, 2012
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC.ABS.6193.2012
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects COnference (NSREC)
Location: Miami, FL
Country: United States
Start Date: July 16, 2012
End Date: July 20, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.

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