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Accelerated Aging Experiments for Capacitor Health Monitoring and PrognosticsThis paper discusses experimental setups for health monitoring and prognostics of electrolytic capacitors under nominal operation and accelerated aging conditions. Electrolytic capacitors have higher failure rates than other components in electronic systems like power drives, power converters etc. Our current work focuses on developing first-principles-based degradation models for electrolytic capacitors under varying electrical and thermal stress conditions. Prognostics and health management for electronic systems aims to predict the onset of faults, study causes for system degradation, and accurately compute remaining useful life. Accelerated life test methods are often used in prognostics research as a way to model multiple causes and assess the effects of the degradation process through time. It also allows for the identification and study of different failure mechanisms and their relationships under different operating conditions. Experiments are designed for aging of the capacitors such that the degradation pattern induced by the aging can be monitored and analyzed. Experimental setups and data collection methods are presented to demonstrate this approach.
Document ID
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Kulkarni, Chetan S.
(Vanderbilt Univ. Nashville, TN, United States)
Celaya, Jose Ramon
(Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) Moffett Field, CA, United States)
Biswas, Gautam
(Vanderbilt Univ. Nashville, TN, United States)
Goebel, Kai
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
July 24, 2014
Publication Date
September 10, 2012
Subject Category
Quality Assurance And Reliability
Electronics And Electrical Engineering
Report/Patent Number
Meeting Information
Meeting: IEEE Autotestcon
Location: Anaheim, CA
Country: United States
Start Date: September 10, 2012
End Date: September 13, 2012
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
Distribution Limits
Public Use Permitted.
Prognostics of Electronics
Electrolytic Capacitors
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