Document Type
Conference Paper
Authors
Kulkarni, Chetan S. (Vanderbilt Univ. Nashville, TN, United States) Celaya, Jose Ramon (Stinger Ghaffarian Technologies, Inc. (SGT, Inc.) Moffett Field, CA, United States) Biswas, Gautam (Vanderbilt Univ. Nashville, TN, United States) Goebel, Kai (NASA Ames Research Center Moffett Field, CA, United States) Date Acquired
July 24, 2014
Publication Date
September 10, 2012
Subject Category
Quality Assurance And ReliabilityElectronics And Electrical Engineering Meeting Information
IEEE Autotestcon(Anaheim, CA)
Funding Number(s)
CONTRACT_GRANT: NNA08CG83C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Prognostics of ElectronicsPHMElectrolytic Capacitors